A Numerical Characterization of the Nanoparticles Distribution on the Surface of a Semiconductor

  • Zdena Rudolfova
  • Jana Hoderova
Keywords: distribution, Voronoi diagram, hypothesis testing, Legendre ellipse, 4PL function, nanoparticles

Abstract

The motivation for this work was to qualitatively describe the distribution of Au nanoparticles on the surface of a semiconductor. We discuss suitable mathematical characteristics which allow the uniform distribution to be distinguished from the distribution a ected by any physical phenomenon, i.e. by the repulsive force between electrically charged particles or by the influence of properties of the surface. We identify Voronoi decomposition and a statistical analysis of Voronoi cell properties as a suitable tool for this purpose.

References

Flusser, J., Suk, T., Zitov´a, B.: Moments and Moment Invariants in Pattern Recognition, Wiley & Sons Ltd., 312 pp. (2009)

Pratt, W. K.: Digital image processing: PIKS Scientific inside. 4th ed., Newly updated and rev. ed. Hoboken, N.J.: Wiley-Interscience (2007)

Starha, P., Druckm¨ullerov´a, H.: Decomposition of a Bunch of Objects in Digital Image. In: ˇ Combinatorial image analysis: 16th International Workshop, IWCIA, Brno, Czech Republic, May 28-30, 2014. Proceedings. 1st edition. Berlin: Springer International Publishing (2014)

Starha, P., Martisek, D., Matousek, R.: Numerical Method of Object Reconstruction Using Moment Method. In: Mendel 2014: 20 th international conference on soft computing: evolutionary computation, genetic programming, fuzzy logic, rough sets, neural networks, fractals, bayesian methods: June 15-17, 2011, Brno, Czech Republic. Brno: University of Technology (2014)

Published
2017-06-01
How to Cite
[1]
Rudolfova, Z. and Hoderova, J. 2017. A Numerical Characterization of the Nanoparticles Distribution on the Surface of a Semiconductor. MENDEL. 23, 1 (Jun. 2017), 125-132. DOI:https://doi.org/10.13164/mendel.2017.1.125.
Section
Research articles